Hitachi S4800 Sem

To log into the PC and PC-SEM software, username and password are “semuser”.

Hitachi s4800 sem. Sem Hitachi S-4800 FESEM With a cold field emission electron source for high resolution, ExB in-lens filter, our Hitachi S-4800 field emission scanning electron microscope is an extremely powerful and flexible tool. Sub-Hz Active Vibration Control Platforms (Pictured:. It uses an electron beam to image the surface of solid materials.

Non-magnetic sample SEM only:. •Cold-cathode Field Emissions Electron source •Accelerating Voltage 0.5 to 30 kV (variable in 0.1kV steps). This Hitachi S-40 FE-SEM is in excellent condition.

This system is fully equipped with a specimen exchange airlock and a STEM detector and a Yag backscatter detector. Imaging voltages 100V to 30KV;. HP OfficeJet Pro 6950, 6960, 6970 Modify to CISS - HP 905, 902, 903, 904 - Duration:.

HITACHI S-4800 FESEM w/EDS;. Both microscopes are equipped with EDS systems for elemental analysis. The image is generated by scanning a small diameter electron beam over the specimen.

T-Base Adapter for Hitachi S-800, S-4000, S-4100, S-40, S-4300, S-4500, S-4700 and S-3600N SEMs. Images are registered to the database automatically when saved. Eckstein Medical Research Building - Room 80 OPERATING INSTRUCTIONS.

Scanning electron microscope (SEM). Hitachi S-4800 Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM). "Scanning electron microscopy (SEM) and transmission elec= tron microscopy (TEM) for materials characterization.".

2 SE-Detectors (normal + In-Lens) YAG-Backscatter-Electron Detector (BSE). Hitachi shall not be responsible for a third party’s claim regarding infringement of any patent rights or industrial properties with respect either to products manufactured through the use of equipment supplied by Hitachi or its related companies or to applications of the Hitachi equipment. HITACHI S-4800 Type I.

Also utilizes beam deceleration for highly increased resolution at low kV. •1.0 nm (at accelerating voltage 15kV) •2.0 nm (at accelerating voltage 1kV) •Magnification:. AVI-400 Supporting Hitachi S4800 SEM.

Operation of the microscope is authorized only after completion of user training. $2,000.00 The Hitachi S-4800 is a Field Emission SEM that excels at ultra-high resolution scanning. The Hitachi S-4700 Scanning Electron Microscope (SEM) is an extremely powerful method for surface analysis, allowing high depth-of-field and high magnification imaging.

Starting from $85 per sample (SEM only), MSE Analytical Services offer professional SEM-EDS characterization service using Hitachi S4800 field emission SEM equipped with EDS, or similar instrument. The S-4800 Basics Workshop introduces new users to the Hitachi S-4800 SEM for high resolution imaging of your specimen. Performance Click to Expand.

HITACHI S-4800 FESEM w/EDS;. Ultra Low Voltage Imaging with Hitachi's S-4800 FE-SEM :. Was successfully immobilized in Cu3(PO4)2-based inorganic hybrid nanoflower through biomimetic mineraliza….

REM – Hitachi S-4800. Activate Chamber Camera using the Camera On/Off button located below the chamber scope monitor. Sample holders for TEM grids and many other accessories included.

For detail, refer to <3.12 Using SEM Data Manager> 2.3.11 Alignment Dialog Window The Alignment dialog window is used for alignment operations. Hitachi S-4800 Scanning Electron Microscope Operating Procedure, v. The Hitachi S-4800 is a Field Emission Scanning Electron Microscope for ultra high resolution imaging.

Hitachi High-Tech in America This website uses JavaScript. Hitachi S-4800 High Resolution Scanning Electron Microscope The S-4800 is a cold field emission high resolution scanning electron microscope with many advanced features. The dark field signal is detected through secondary electrons.

At a shorter working distance, higher resolution is obtainable. AVI-400 Supporting SEM) AVI-400 Supporting Carl Zeiss Sigma VP SEM. Hitachi S-4800 Type II / ThermoNORAN NSS EDS:.

The SEM has a magnifi cation power of 300,000 times actual size. Beam deceleration (ultra-low landing voltages (100-500 V) for shallow surface topography). Jul 30, 15 Real-time 3D Analytical FIB-SEM Composite Instrument NX9000 Released.

Getting started with SEM. Sample loading, Alignments, Capturing and saving a picture. The Hitachi S-4800 field emission scanning electron microscope features a maximum resolution of 1.0 nm and a variable acceleration voltage of .5 - 30 kV.

Image quality before (left) and after (right) SEM-Base installation. Press AIR button on load lock and wait for beep. SEM SCANNING ELECTRON MICROSCOPE SERVICES - Hitachi S-4800 Scanning Electron Microscopy (SEM) Imaging and EDX Spectroscopy Materials Analysis Services S-4700, S4500 - services on HTE Labs Wafer Fab - Research and Development Laboratories for semiconductor optoelectonics sensors microwave thin film active and passive components.

The S-4800 Cold Field Emission SEM combines the outstanding high resolution performance capabilities to offer superb resolution of ~ 2.0 nm at 30 kV. The Hitachi S-4800 is a field emission scanning electron microscope (FE-SEM), capable of high resolution imaging and specimen topography study from nanometers to millimeters. SEM Type OEM Resolution Operating system Pixel Density Chamber or Sample Size Stage Specifications Options;.

Operating Procedure for Hitachi S-4800 Scanning Electron Microscope CFN Laboratory 1L-32 C.Black/G.Wright Operation of the Hitachi S-4800 Scanning Electron Microscope (SEM) requires specific user training and authorization. Hitachi’s latest computer-assisted technology is incorporated in SU5000. The operator can automate many operations and efficiently utilize their high performance.

ERiC Miller, 7-07 (O), 9-872-1851 (mobile). EDS detection range Boron and higher;. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

Download PDF Version << Back to Application Notes List. The SEM server is accessible through two. Standard Operating Procedures for Hitachi s-4800 High resolution SEM WD (working distance) is the distance between the bottom face of the objective lens and the surface of the specimen.

Hitachi S-4800 is an electron beam microscope, that accelerates an elect= ron beam in a vacuum environment to interact electrons with the sample of i= nterest. New “Super ExB Filter” collects and separates the various components of pure SE, compositional SE and BSE electron signals. To log into the PC and PC-SEM software, username and password are “semuser”.

HITACHI SCIENTIFIC INSTRUMENT TECHNICAL DATA >SEM NO.111 The dark field STEM function uses an electrode which con-verts scattered electrons into secondary electrons as shown in Fig. High Resolution Low Voltage imaging 1.0 nm resolution at 15 kV, WD=4mm;. With the Hitachi STEM detector on the S-4800 FESEM images, comparable to a dedicated TEM or STEM results, are easily obtainable without the need for an advanced experience in TEM or the large budget for such high-end equipment.

The Hitachi S-4800 SEM features:. The instrument is designed mainly for observation and evaluation of specimens prepared for observation using SEM. The Department has a modern electron microscope facility that is used by students, faculty and staff.

AMRAY 3600 Field Emission SEM. Mar 5, 15 Hitachi High-Technologies Corporation Receives Intel's Prestigious Supplier Continuous Quality Improvement Award. Attached are the optional YAG BSE & STEM (TE) detector.

The transmissibility graph represents the vibration isolation performance of the AVI-400 Series over a frequency domain. The Hitachi fi eld emission scanning electron microscope (FE-SEM) is used for inspection of nanostructures. Magnetic sample SEM only:.

Within the S4800 folder on the SEM Server (U:\). Since this function operates at a short working distance (WD) of. Price available on request.

Field emission scanning electron microscope (FE-SEM) With HORIBA EDX system Workstation:. Topographical features, morphology, compositional differences, and the presence and location of defects can be examined in a wide range of sample types. This large chamber microscope operates in a variable pressure as well as high vacuum modes allowing more flexibility to handle wide range of specimens.

It is equipped with an Hitachi S4800 scanning electron microscope and an Hitachi H600 transmission electron microscope. 2 - 52 2.3.10 SEM Data Manager Window SEM Data Manager is an image-filing program with an easy-to-operate database function. It is equipped with a 5-axis motorized stage and a user-friendly GUI control.

Magnification X to 800,000X;. To log into the PC and PC-SEM software, the username and password are set by. Capable of imaging from 100x to 800,000x magnification.

Open load lock door using. This workshop is offered once a month, with the group sessions taking place over two half day sessions, followed by two one-on-one half day sessions with you, your sample, and one of our staff, followed by a written and practical examination session. Verify that the Hitachi PC-SEM software is running on the left-hand screen.

High Resolution Fieldemission (Cold Emission) Scanning Microscope DISS5 Control Software Location:. KLA-Tencor Electron Source (refurbished) KLA-Tencor Parts for CD-SEM. Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability.

Low Voltage Transmission Imaging with Hitachi's S-4800 FE-SEM. Activate Chamber Camera using the Camera On/Off button located below the chamber scope monitor if it is not already on. Pharmazentrum (PZ U1003) Equipment:.

Offered Complete and in service condition. 9043-06 Was running in the lab to de install date of July 15 o Now in clean dry storage, see photos starting on page 19 Maintained by Hitachi service since installation Basic S4800 System Specifications. The S-4800 Cold Field Emission SEM combines the outstanding high-resolution performance capabilities to offer superb resolution of ~ 2.0 nm at 30 kV.

If you are not included on a list of authorized SEM users then STOP and obtain access authorization prior to use. Verify that the Hitachi PC-SEM software is running on the left-hand screen. The H600 may also be operated in STEM mode.

2.0 nm resolution at 1 kV, WD=1.5mm, Normal mode;. The NEW Hitachi SU5000 VP-SEM with Schottky Field Emission source was recently added to EM Facility at AMRL. The performance data is.

These electrons are scattered from the surface, and are then collected to. The equipment is equipped with a EDX detector for the detection of chemical elements on your sample at higher voltages. Verify that the Hitachi PC-SEM software is running on the left-hand screen.

Field-Emission SEM - Cold field emission electron gun;. • Note that Hitachi High-Technologies Corporation will not be responsible for injury or damage caused by usage of the instrument in a manner not. SEM + EDS spot:.

EDS Quant, line, map, imaging. HITACHI S-4700 (II) FESEM;. Hitachi_4800_STEM.pdf (size 2.68 MB) page top;.

Hitachi S-4800 Type I SEM with EDS Resolution:. 1 CONFIDENTIAL >>> Hitachi S4800 FE SEM with Horiba EDS/X System <<< Includes Hitachi E-1045 Ion Sputter Sample Prep System Vintage 08, Serial Number:. Thermophilic lipase QLM from Alcaligenes sp.

At a longer WD, a larger tilt angle and a greater depth of focus are. Specimen exchange T-base adapter incorporates an aluminum body and self-aligning double sided brass thread block to facilitate smooth insertion on the SEM stage and to prevent binding. Both secondary electron and backscattering electron detectors are available for imaging.It features an image capture system for digital storage of images and image files can be transfered.

The width of each image represents 0 nm. Black 8/11/11 Applying the SEM high voltage WARNING:. Resolution 1nm at 15 KV, 1.4nm at 1KV;.

We provide Ultra Low Voltage Imaging with Hitachi's S-4800 FE-SEM. Press AIR button on load lock and wait for beep. APPLICATION • The S-4800 SEM utilizes electron beam accelerated at 500 V to 30 kV.

This operating procedure is meant as a general overview of tool. The S-4800 Basics Workshop introduces new users to the Hitachi S-4800 SEM for high resolution imaging of your specimen. 1.4 nm resolution at 1 kV, WD=1.5nm, Deceleration mode;.

BSE low and/or high angle;. STEM (Scanning Transmission Electron Microscopy) on a conventional SEM is a useful tool for biological applications.